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Proceedings Paper

Characterization of the Shuttle Landing Facility as a laser range for testing and evaluation of EO systems
Author(s): Frida Stromqvist Vetelino; Michael R. Borbath; Larry C. Andrews; Ronald L. Phillips; Geoffrey L. Burdge; Peter G. Chin; Darren J. Galus; David Wayne; Robert Pescatore; Doris Cowan; Frederick Thomas
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Paper Abstract

The Shuttle Landing Facility runway at the Kennedy Space Center in Cape Canaveral, Florida is almost 5 km long and 100 m wide. Its homogeneous environment makes it a unique and ideal place for testing and evaluating EO systems. An experiment, with the goal of characterizing atmospheric parameters on the runway, was conducted in June 2005. Weather data was collected and the refractive index structure parameter was measured with a commercial scintillometer. The inner scale of turbulence was inferred from wind speed measurements and surface roughness. Values of the crosswind speed obtained from the scintillometer were compared with wind measurements taken by a weather station.

Paper Details

Date Published: 18 August 2005
PDF: 7 pages
Proc. SPIE 5891, Atmospheric Optical Modeling, Measurement, and Simulation, 589101 (18 August 2005); doi: 10.1117/12.619466
Show Author Affiliations
Frida Stromqvist Vetelino, Univ. of Central Florida (United States)
Michael R. Borbath, Harris Corp. (United States)
Larry C. Andrews, Univ. of Central Florida (United States)
Ronald L. Phillips, Florida Space Institute, Univ. of Central Florida (United States)
Geoffrey L. Burdge, Harris Corp. (United States)
Peter G. Chin, Harris Corp. (United States)
Darren J. Galus, Harris Corp. (United States)
David Wayne, Florida Space Institute, Univ. of Central Florida (United States)
Robert Pescatore, Florida Space Institute, Univ. of Central Florida (United States)
Doris Cowan, Univ. of Central Florida (United States)
Frederick Thomas, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 5891:
Atmospheric Optical Modeling, Measurement, and Simulation
Stephen M. Doss-Hammel; Anton Kohnle, Editor(s)

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