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Proceedings Paper

Maxbeam2: a new method of identifying salient Beamlets
Author(s): Jonathan Edwards; Jim Nicholson; Simon O'Keefe
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Paper Abstract

Beamlet processing is a powerful and flexible approach to the identification of line based structures in data. The processing method is efficient (O(n2)) and also robust to variation in direction of the line continuation. This paper identifies two weaknesses with the current approach: the inability to identify lines at variable intensity, and with variation in width. These are addressed with a simple modification to the process used in selecting the salient beamlets called maxbeam2. This is demonstrated on a line image with variation in signal intensity and line width. The technique appears to correct the above weaknesses with only a small amount of extra processing, and hence make beamlets more generally applicable.

Paper Details

Date Published: 17 September 2005
PDF: 9 pages
Proc. SPIE 5914, Wavelets XI, 591426 (17 September 2005); doi: 10.1117/12.619446
Show Author Affiliations
Jonathan Edwards, The Univ. of York (United Kingdom)
Jim Nicholson, Qinetiq (United Kingdom)
Simon O'Keefe, The Univ. of York (United Kingdom)


Published in SPIE Proceedings Vol. 5914:
Wavelets XI
Manos Papadakis; Andrew F. Laine; Michael A. Unser, Editor(s)

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