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Proceedings Paper

Modeling contamination migration on the Chandra X-ray Observatory
Author(s): Stephen L. O'Dell; Douglas A. Swartz; Paul P. Plucinsky; Mark A. Freeman; Maxim L. Markevitch; Alexey A. Vikhlinin; Kenny C. Chen; Rino J. Giordano; Perry J. Knollenberg; Peter A. Morris; Hien Tran; Neil W. Tice; Scot K. Anderson
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Paper Abstract

During its first 6 years of operation, the cold (-60°C) optical blocking filter of the Advanced CCD Imaging Spectrometer (ACIS), on board the Chandra X-ray Observatory, has accumulated a contaminating layer that attenuates the low-energy x rays. To assist in assessing the likelihood of successfully baking off the contaminant, members of the Chandra team developed contamination-migration simulation software. The simulation follows deposition onto and (temperature-dependent) vaporization from surfaces comprising a geometric model of the Observatory. A separate thermal analysis, augmented by on-board temperature monitoring, provides temperatures for each surface of a similar geometric model. This paper describes the physical basis for the simulations, the methodologies, and the predicted migration of the contaminant for various bake-out scenarios and assumptions.

Paper Details

Date Published: 30 August 2005
PDF: 12 pages
Proc. SPIE 5898, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV, 589813 (30 August 2005); doi: 10.1117/12.619310
Show Author Affiliations
Stephen L. O'Dell, NASA Marshall Space Flight Ctr. (United States)
Douglas A. Swartz, Universities Space Research Association (United States)
Paul P. Plucinsky, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Mark A. Freeman, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Maxim L. Markevitch, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Alexey A. Vikhlinin, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Kenny C. Chen, Northrop Grumman Space Technology (United States)
Rino J. Giordano, Northrop Grumman Space Technology (United States)
Perry J. Knollenberg, Northrop Grumman Space Technology (United States)
Peter A. Morris, Northrop Grumman Space Technology (United States)
Hien Tran, Northrop Grumman Space Technology (United States)
Neil W. Tice, Lockheed Martin (United States)
Scot K. Anderson, Lockheed Martin (United States)


Published in SPIE Proceedings Vol. 5898:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV
Oswald H. W. Siegmund, Editor(s)

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