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Proceedings Paper

Study of a soft x-ray (1-5 nm) laser plasma source for femtosecond time resolved XAS
Author(s): S. Fourmaux; L. Lecherbourg; J. C. Kieffer; F. Martin; H. Pépin; M. Chaker; S. Magnan; C. Y. Coté
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Paper Abstract

The dynamics of ultrafast phase transition and reaction mechanisms can be deduced from ultrafast x-ray diffraction or absorption measurements. Femtosecond lasers have been used recently to study matter dynamics with optical-pump and x-ray probe spectroscopy, using monochromatic K alpha x-ray radiation. We present here our most recent progress in the development of a femtosecond time- resolved x-ray absorption spectroscopy (XAS) system based on a broadband soft x-ray source in the 1-5 nm range. The femtosecond XAS system is designed to probe the electronic dynamics occurring during the vanadium dioxide (VO2) semiconductor to metal phase transition following excitation by a femtosecond laser pulse. In the present experiments, broadband spectra near the vanadium L edge (511 eV) and oxygen K edge (525 eV) of VO2 have been generated and measured with simultaneously high signal to noise ratio (100), high spectral resolution (ΔE/E=4x10-3) and a 1.2 ps temporal resolution.

Paper Details

Date Published: 21 September 2005
PDF: 9 pages
Proc. SPIE 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications, 592004 (21 September 2005); doi: 10.1117/12.619271
Show Author Affiliations
S. Fourmaux, Univ. du Québec (Canada)
L. Lecherbourg, Univ. du Québec (Canada)
J. C. Kieffer, Univ. du Québec (Canada)
F. Martin, Univ. du Québec (Canada)
H. Pépin, Univ. du Québec (Canada)
M. Chaker, Univ. du Québec (Canada)
S. Magnan, AXIS Photonique Inc. (Canada)
C. Y. Coté, AXIS Photonique Inc. (Canada)


Published in SPIE Proceedings Vol. 5920:
Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
Zenghu Chang; Stuart Kleinfelder; Dennis L. Paisley; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

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