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Proceedings Paper

Projected fringe profilometry using holographic techniques for large-scale measurements
Author(s): Wei-Hung Su; Wei-Jen Chen; Hung-Jei Kao; Chia-Jeng Huang
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Paper Abstract

A technique using diffractive elements for finding the absolute shape of a large-scale object is proposed. It is found that an accurate projected fringe profilometer can be built by applying the holographic technique in the system. The advantages of using the presented technique for projected fringe profilometry are: (1) a large depth of field; (2) very fringe distortion (even for a large field of view); and (3) a very compact design for the measurement system.

Paper Details

Date Published: 8 September 2005
PDF: 10 pages
Proc. SPIE 5911, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI, 59110Q (8 September 2005); doi: 10.1117/12.618870
Show Author Affiliations
Wei-Hung Su, National Sun Yat-Sen Univ. (Taiwan)
Wei-Jen Chen, National Sun Yat-Sen Univ. (Taiwan)
Hung-Jei Kao, National Sun Yat-Sen Univ. (Taiwan)
Chia-Jeng Huang, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 5911:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI
Francis T. S. Yu; Ruyan Guo; Shizhuo Yin, Editor(s)

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