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Proceedings Paper

Highly sensitive in-line fiber-optic structure for refractometric measurements
Author(s): Blagoy Pantchev; Andrey Andreev; Parvaneh Danesh; Blagovesta Zafirova; E. Karakoleva; E. Vlaikova; Emilia Alipieva
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Paper Abstract

A refractometric structure consisting of a side-polished single-mode optical fiber covered with a thin film of hydrogenated amorphous silicon (a-Si:H) has been studied. a-Si:H films have been deposited by plasma-enhanced chemical vapour decomposition of silane. The sensors elements working with zero and first order optical modes of the amorphous silicon waveguide have been demonstrated. A high sensitivity of 5300 nm per unit refractive index has been obtained for the low values of superstrate refractive indices in the range of 1.33-1.38 by using a-Si:H film with a thickness of about 14 nm, i.e. the interaction with TE0 mode of the PWG. Despite of the very low thickness of the a-Si:H film there is no need of any additional layer protecting the structure from the analyzed medium. The mechanical and optical stability of the film and its very good adhesion to fused silica eliminate the possibility of the film damaging and makes the structure reliable in use.

Paper Details

Date Published: 22 April 2005
PDF: 5 pages
Proc. SPIE 5830, 13th International School on Quantum Electronics: Laser Physics and Applications, (22 April 2005); doi: 10.1117/12.618775
Show Author Affiliations
Blagoy Pantchev, Institute of Solid State Physics (Bulgaria)
Andrey Andreev, Institute of Solid State Physics (Bulgaria)
Parvaneh Danesh, Institute of Solid State Physics (Bulgaria)
Blagovesta Zafirova, Institute of Solid State Physics (Bulgaria)
E. Karakoleva, Institute of Solid State Physics (Bulgaria)
E. Vlaikova, Institute of Solid State Physics (Bulgaria)
Emilia Alipieva, Institute of Electronics (Bulgaria)


Published in SPIE Proceedings Vol. 5830:
13th International School on Quantum Electronics: Laser Physics and Applications

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