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Proceedings Paper

An ultra-fast x-ray streak camera for the study of magnetization dynamics
Author(s): J. Feng; W. Wan; J. Qiang; A. Bartelt; A. Comin; A. Scholl; J. Byrd; R. Falcone; G. Huang; A. MacPhee; J. Nasiatka; K. Opachich; D. Weinstein; T. Young; H. A. Padmore
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Paper Abstract

An ultrafast x-ray streak camera is under development at LBNL for application primarily to studies of ultrafast magnetization dynamics. In initial work, a temporal resolution of 900fs in accumulative mode at 5 KHz has been achieved. These results and methods currently being developed to improve the resolution and repetition rate are resented. One of the primary limits to temporal resolution is caused by the finite energy width of the electron distribution from the photocathode. The positive time of flight dispersion with energy in the accelerating region of the camera can be countered by introduction of downstream optics that give negative time of flight dispersion with energy, leading to an approximate overall cancellation of this temporal aberration. Initial results of an end-to-end simulation model using the full photoelectron distribution are presented.

Paper Details

Date Published: 21 September 2005
PDF: 8 pages
Proc. SPIE 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications, 592009 (21 September 2005); doi: 10.1117/12.618749
Show Author Affiliations
J. Feng, Lawrence Berkeley National Lab. (United States)
W. Wan, Lawrence Berkeley National Lab. (United States)
J. Qiang, Lawrence Berkeley National Lab. (United States)
A. Bartelt, Lawrence Berkeley National Lab. (United States)
A. Comin, Lawrence Berkeley National Lab. (United States)
A. Scholl, Lawrence Berkeley National Lab. (United States)
J. Byrd, Lawrence Berkeley National Lab. (United States)
R. Falcone, Univ. of California, Berkeley (United States)
G. Huang, Lawrence Berkeley National Lab. (United States)
A. MacPhee, Lawrence Berkeley National Lab. (United States)
J. Nasiatka, Lawrence Berkeley National Lab. (United States)
K. Opachich, Lawrence Berkeley National Lab. (United States)
D. Weinstein, Cornell Univ. (United States)
T. Young, Lawrence Berkeley National Lab. (United States)
H. A. Padmore, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 5920:
Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
Zenghu Chang; Jean-Claude Kieffer; Jerome B. Hastings; Stuart Kleinfelder; Dennis L. Paisley, Editor(s)

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