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Proceedings Paper

Refractometric investigation and analysis of nano-scaled dispersions
Author(s): Yanko Sarov; Ivan Kostic; I. Capek; R. Andok; Valentina Sarova; P. Capek; Ivo W. Rangelow
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Paper Abstract

This work presents the applications of the method of the disappearing diffraction pattern for refractometric measurements and analysis of scattering media. The behavior of the refractive indices of different aqueous dispersions containing metal and polymer particles is studied theoretically and experimentally. Both metallic and latex solutions exhibit linear dependence of the refractive index on the concentration of particles. Values of the specific refractive index increment dn/dc for Co, Fe and Ag nano-dispersions are calculated. Poly(2-ethylhexyl) acrylate and poly(vinyl acetate) latexes with size of particles between 50 and 1300 nm and concentration up to the maximum possible are systematically studied with respect to the properties of the particles-concentration, diameter and refractive index. Empirical relationships are derived for the investigated latexes, describing the dependence of the refractive index of latexes on their properties and on the light wavelength. Such approach could be used to solve the inverse problem of calculating the concentration or the size of particles, measuring the refractive index. It is shown that the refractometry provides a simple, easy and accurate way to study and analyze properties of dense nano- and micro-dispersions.

Paper Details

Date Published: 22 April 2005
PDF: 5 pages
Proc. SPIE 5830, 13th International School on Quantum Electronics: Laser Physics and Applications, (22 April 2005); doi: 10.1117/12.618699
Show Author Affiliations
Yanko Sarov, Central Lab. of Optical Storage and Processing of Information (Bulgaria)
Institute of Informatics (Slovak Republic)
Ivan Kostic, Institute of Informatics (Slovak Republic)
I. Capek, Polymer Institute (Slovak Republic)
R. Andok, Institute of Informatics (Slovak Republic)
Valentina Sarova, Institute of Electronics (Bulgaria)
P. Capek, Institute of Chemistry (Slovak Republic)
Ivo W. Rangelow, Univ. of Kassel (Germany)


Published in SPIE Proceedings Vol. 5830:
13th International School on Quantum Electronics: Laser Physics and Applications

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