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Proceedings Paper

AM Multipurpose High-Resolution Imaging Topological Radar (ITR): reverse engineering and artworks monitoring and restoration
Author(s): Massimiliano Guarneri; Luciano Bartolini; Giorgio Fornetti; Mario Ferri De Collibus; Luigi De Dominicis; Emiliano Paglia; Claudio Poggi; Roberto Ricci
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Paper Abstract

A high resolution Amplitude Modulated Imaging Laser Radar (AM-LR) sensor has recently been developed, aimed to accurately reconstructing 3D digital models of real targets - either single objects or large amplitude complex scenes. The system sounding beam can be swept linearly across the object or circularly around it, by placing the object on a controlled rotating platform. Both intensity and phase shift of the back-scattered light are then collected and processed, providing respectively a shade-free photographic-like picture and accurate range data in the form of a range or depth image, with accuracy depending mainly on the laser modulation frequency. The development of software, suitable for simultaneous 3D rendering of the intensity and absolute distance data collected by the ITR, constitutes one of the main objectives of the research activity, whatever is the application pursued. In fact, high resolution AM-LR systems have a great interest for their potentials in accurate 3D imaging of valuable objects which must be preserved in digital archives. Examples range from artwork monitoring, cataloguing and restoration from sparse fragments, to medicine for non-hazardous diagnostics and fast design of bio-compatible prostheses, to microtechnology in the miniaturization of macro-components (plastic prototypes, quality control). Several meaningful results of measurements executed in various important European archaeological sites, in particular Santa Maria Antiqua church situated in Fori Imperiali area in Rome and Costanza (Romania), involving 3D color mapped representation are also presented.

Paper Details

Date Published: 18 August 2005
PDF: 10 pages
Proc. SPIE 5880, Optical Diagnostics, 588001 (18 August 2005); doi: 10.1117/12.618641
Show Author Affiliations
Massimiliano Guarneri, C.R. Enea Frascati (Italy)
Luciano Bartolini, C.R. Enea Frascati (Italy)
Giorgio Fornetti, C.R. Enea Frascati (Italy)
Mario Ferri De Collibus, C.R. Enea Frascati (Italy)
Luigi De Dominicis, C.R. Enea Frascati (Italy)
Emiliano Paglia, C.R. Enea Frascati (Italy)
Claudio Poggi, C.R. Enea Frascati (Italy)
Roberto Ricci, C.R. Enea Frascati (Italy)


Published in SPIE Proceedings Vol. 5880:
Optical Diagnostics
Leonard M. Hanssen; Patrick V. Farrell, Editor(s)

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