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Proceedings Paper

MODIS polarization ray tracing analysis
Author(s): N. Souaidia; D. Moyer; G. Meister; S. Pellicori; E. Waluschka; K. Voss
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Paper Abstract

On-orbit optical sensors are the primary data source for the remote sensing community. A rigorous pre-flight characterization and calibration is a key to the success of their mission. Indeed, preliminary calibration and correction factors are determined during this process. As part of this process, prior to the launch of NASA's Moderate Resolution Imaging Spectroradiometer (MODIS) its polarization sensitivity was measured. In this work, our goal was to simulate these measurements using computer ray tracing software. Based on that, we could evaluate the evolution of the different coatings (Mirror, Beam splitters, Anti-reflection and Band pass filters) due to degradation over time. We were able to simulate the measurements and obtained what the theoretical polarization sensitivity should be. The results were compared to the pre-launch measurements and an analysis of the whole MODIS optical system was performed in order to explain these differences. A full description of the MODIS polarization ray tracing procedure along with a discussion on the results and their implications on past, present and future work will be given.

Paper Details

Date Published: 18 August 2005
PDF: 8 pages
Proc. SPIE 5888, Polarization Science and Remote Sensing II, 58880H (18 August 2005); doi: 10.1117/12.617635
Show Author Affiliations
N. Souaidia, Univ. of Miami (United States)
D. Moyer, Science Systems and Applications Inc. (United States)
G. Meister, Futuretech Corp. (United States)
S. Pellicori, Pellicori Optical Consulting (United States)
E. Waluschka, NASA Goddard Space Flight Ctr. (United States)
K. Voss, Univ. of Miami (United States)


Published in SPIE Proceedings Vol. 5888:
Polarization Science and Remote Sensing II
Joseph A. Shaw; J. Scott Tyo, Editor(s)

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