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Proceedings Paper

Analysis of trap distribution for smectic liquid crystals using time of flight spectroscopy
Author(s): Akira Ohno; Hiroaki Iino; Kensuke Kurotaki; Akihide Haruyama; Jun-ichi Hanna; David H. Dunlap
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Paper Abstract

We analyzed the experimental time-of-flight data for photoinjected holes in two smectic liquid crystals, the first consisting of a phenylnaphthalene derivative 8PNPO12, and the second consisting of a biphenyl derivative 6OBP6. We fit the time of flight transients for different electric field strengths to a multiple trapping model (MTM). From these fits we determined the distribution of trap depths, under the assumption that (i) linear response is valid, and (ii) the trap release rates are independent of field.

Paper Details

Date Published: 9 October 2005
PDF: 10 pages
Proc. SPIE 5937, Organic Light-Emitting Materials and Devices IX, 59371X (9 October 2005); doi: 10.1117/12.617632
Show Author Affiliations
Akira Ohno, Tokyo Institute of Technology (Japan)
Hiroaki Iino, Tokyo Institute of Technology (Japan)
Kensuke Kurotaki, Tokyo Institute of Technology (Japan)
Akihide Haruyama, Tokyo Institute of Technology (Japan)
Jun-ichi Hanna, Tokyo Institute of Technology (Japan)
David H. Dunlap, Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. 5937:
Organic Light-Emitting Materials and Devices IX
Zakya H. Kafafi; Paul A. Lane, Editor(s)

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