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Proceedings Paper

Narrow-band EUV multilayer coating for the MOSES sounding rocket
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Paper Abstract

The Multi-order Solar EUV Spectrograph (MOSES) is a slitless spectrograph designed to study solar He II emission at 303.8 Å (1 Å = 0.1 nm), to be launched on a sounding rocket payload. One difference between MOSES and other slitless spectrographs is that the images are recorded simultaneously at three spectral orders, m = -1, 0, +1. Another is the addition of a narrow-band multilayer coating on both the grating and the fold flat, which will reject out-of-band lines that normally contaminate the image of a slitless instrument. The primary metrics for the coating were high peak reflectivity and suppression of Fe XV and XVI emission lines at 284 Å and 335 Å, respectively. We chose B4C/Mg2Si for our material combination since it provides excellent peak reflectivity and rejection of out-of-band wavelengths. Measurements of witness flats at NIST indicate the peak reflectivity at 303.8 is 39.0% for a 15 bilayer stack, while suppression ranges from 7.5x to 12.9x at 284 Å and from 3.4x to 15.1x at 335 Å for the individual reflections in the optical path. We present the results of coating the MOSES flight gratings and fold flat, including the spectral response of the fold flat and grating as measured at NIST's SURF III and Brookhaven's X24C beamline, respectively.

Paper Details

Date Published: 8 September 2005
PDF: 9 pages
Proc. SPIE 5900, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II, 590003 (8 September 2005); doi: 10.1117/12.617520
Show Author Affiliations
Scott M. Owens, Goddard Space Flight Ctr. (United States)
Jeffery S. Gum, Goddard Space Flight Ctr. (United States)
Charles Tarrio, National Institute of Standard and Technology (United States)
Steven Grantham, National Institute of Standard and Technology (United States)
Joseph Dvorak, Montana State Univ. (United States)
Benjawan Kjornrattanawanich, Univ. Space Research Assoc.,Brookhaven National Lab. (United States)
Ritva Keski-Kuha, Goddard Space Flight Ctr. (United States)
Roger J. Thomas, Goddard Space Flight Ctr. (United States)
Charles C. Kankelborg, Montana State Univ. (United States)


Published in SPIE Proceedings Vol. 5900:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy II
Oberto Citterio; Stephen L. O'Dell, Editor(s)

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