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Proceedings Paper

Wet/dry film thickness measurement of paint by absorption spectroscopy with acousto-optic tunable filter spectrometer
Author(s): Pranay G. Sinha; Xiangchun Xiong; Feng Jin; Sudhir Trivedi; Narashima S. Prasad
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Paper Abstract

Controlling/monitoring the thickness of applied paint in real time is important to many situations including painting ship and submarine hulls in dry docks for maintaining health of ships and submarines against the harshness of the sea, in automobile and aerospace industries, and in a variety of other industries as a control sensor that plays significant role in product quality, process control, and cost control. Insufficient thickness results to inadequate protection while overspray leads to waste and pollution of the environment. A rugged instrumentation for the real time non-contact accurate measurement of wet and dry paint film thickness measurement will be immensely valuable. As paint is applied with several layers of the same or different type, thickness of each newly sprayed wet layer is of most interest, but measurement on dry paint is also useful. In this study, we use acousto-optic tunable filter-based near infrared spectrometer to obtain the absorption spectrum of layers of paint sprayed on sand blasted steel surface and thus measure the thickness of coating under both wet and dry situations. NIR spectra are obtained from 1100 to 2300 nm on four sample of different thickness of paint up to 127 micron. Partial least squares model built with the spectra shows good correlation with standard error of prediction within ~ 0.7 micron. Results indicate that the spectra also respond to the amount of organic solvent in the wet paint and can be used to monitor the degree of dryness of the paint in real time.

Paper Details

Date Published: 18 August 2005
PDF: 9 pages
Proc. SPIE 5880, Optical Diagnostics, 58800I (18 August 2005); doi: 10.1117/12.617312
Show Author Affiliations
Pranay G. Sinha, Brimrose Corporation of America (United States)
Xiangchun Xiong, Brimrose Corporation of America (United States)
Feng Jin, Brimrose Corporation of America (United States)
Sudhir Trivedi, Brimrose Corporation of America (United States)
Narashima S. Prasad, NASA Langley Research Center (United States)

Published in SPIE Proceedings Vol. 5880:
Optical Diagnostics
Leonard M. Hanssen; Patrick V. Farrell, Editor(s)

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