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Proceedings Paper

Progress on smart focal plane technologies for extremely large telescopes
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Paper Abstract

A key instrument for an Extremely Large Telescope (ELT) is likely to be multi-object spectrometer which observes at least 100 discrete sources with diffraction limited spatial resolution and moderate spectral resolution in the wavelength region from 1.0 to 2.5 μm. Such an instrument has been chosen as the principal driver for the Smart Focal Planes technology development project which has brought together 14 companies and institutes in Europe and Australia. An overview of a new ELT instrument concept based upon beam manipulators (including novel 'starbug' miniature robots) is presented; supported by a summary of scientific goals and systems requirements. Progress made on specific support technology studies is also presented, including work on image slicer replication and cryogenic reconfigurable slits.

Paper Details

Date Published: 18 August 2005
PDF: 12 pages
Proc. SPIE 5904, Cryogenic Optical Systems and Instruments XI, 59040T (18 August 2005); doi: 10.1117/12.617217
Show Author Affiliations
Colin Cunningham, UK Astronomy Technology Ctr. (United Kingdom)
Eli Atad, UK Astronomy Technology Ctr. (United Kingdom)
Jeremy Bailey, Anglo Australian Observatory (Australia)
Fabio Bortoletto, INAF-Astronomical Observatory of Padova (Italy)
Francisco Garzon, Instituto Astrofisica Canarias (Spain)
Peter Hastings, UK Astronomy Technology Ctr. (United Kingdom)
Roger Haynes, Anglo Australian Observatory (Australia)
Callum Norrie, UK Astronomy Technology Ctr. (United Kingdom)
Ian Parry, Univ. of Cambridge (United Kingdom)
Eric Prieto, Lab. d'Astrophysique Marseille (France)
Suzanne Ramsay Howat, UK Astronomy Technology Ctr. (United Kingdom)
Juergen Schmoll, Univ. of Durham (United Kingdom)
Lorenzo Zago, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Frederic Zamkotsian, Lab. d'Astrophysique de Marseille (France)


Published in SPIE Proceedings Vol. 5904:
Cryogenic Optical Systems and Instruments XI
James B. Heaney; Lawrence G. Burriesci, Editor(s)

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