Share Email Print

Proceedings Paper

Developments in high count rate microchannel plate detectors
Author(s): J. S. Lapington
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We are currently investigating techniques to improve the count rate and time resolution of microchannel plates (MCPs) and high speed electronic image readout schemes, as the basis for the development of high performance imaging MCP detectors for space science and other disciplines. We discuss the factors limiting the ultimate count rate and time resolution of MCP detectors and review the potential of techniques such as bulk conductive glass in MCP manufacture, and the advantages conferred by small MCP pore size. We present test results indicating the improved time resolution achievable using small pore MCPs. We review developments in readout design to increase performance for high throughput detectors, and which are capable of providing suitable combinations of attributes for specific applications, including high spatial resolution, high time resolution, high count rate, and parallel event processing for detection of simultaneous events. High throughput techniques require an increase in processing channel density and we discuss how this may be achieved by integration of the readout with the electronics package. The design and manufacture of readout systems using integrated ASIC based electronics is discussed and projected performance is presented. Such devices also have uses over a wide range of other scientific disciplines, and we discuss applications ranging from biomedicine to synchrotron physics.

Paper Details

Date Published: 18 August 2005
PDF: 10 pages
Proc. SPIE 5898, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV, 58980E (18 August 2005); doi: 10.1117/12.616796
Show Author Affiliations
J. S. Lapington, Univ. of Leicester (United Kingdom)

Published in SPIE Proceedings Vol. 5898:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV
Oswald H. W. Siegmund, Editor(s)

© SPIE. Terms of Use
Back to Top