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Proceedings Paper

A new approach to predict computer controlled polishing results
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Paper Abstract

A novel approach to handle and quantify a computer controlled polishing process will be introduced. This approach will be compared to real data. This comparison indicates the correctness of this approach. Based on it a formula has been developed to predict the results of a computer controlled polishing process. The formula will be used to predict real polishing processes and the results will be compared to the real results. The limits when using this formula will be shown along with suggestions when the formula would be useful. This rough prediction of the computer controlled polishing results may be used to enhance the automation of a computer controlled polishing process. Also a way to improve the formula itself will be introduced. It is the opinion of the author that by further stabilizing of the whole computer controlled polishing process the whole system becomes more robust, the prediction more accurate and the whole system improves in reliability and the results become better.

Paper Details

Date Published: 18 August 2005
PDF: 9 pages
Proc. SPIE 5869, Optical Manufacturing and Testing VI, 58690H (18 August 2005); doi: 10.1117/12.616780
Show Author Affiliations
Elmar Pitschke, Univ. of Applied Sciences Deggendorf (Germany)
Univ. of the West of England (United Kingdom)
Markus Schinhaerl, Univ. of Applied Sciences Deggendorf (Germany)
Andreas Geiss, Univ. of Applied Sciences Deggendorf (Germany)
Peter Sperber, Univ. of Applied Sciences Deggendorf (Germany)
Rolf Rascher, Univ. of Applied Sciences Deggendorf (Germany)
Richard Stamp, Univ. of the West of England (United Kingdom)
Lyndon Smith, Univ. of the West of England (United Kingdom)
Melvyn Smith, Univ. of the West of England (United Kingdom)


Published in SPIE Proceedings Vol. 5869:
Optical Manufacturing and Testing VI
H. Philip Stahl, Editor(s)

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