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Proceedings Paper

Study on monitoring freezing disasters in winter wheat by remote sensing and variational techniques
Author(s): Xuefen Zhang; Huailiang Chen; Chunhui Zou; Youfei Zheng; Shitao Wang; Dong Chen; Xiangjian Fu
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Paper Abstract

This work was based upon the combination of space- and ground-based data. Sensings at 1.1 km × 1.1 km resolution from the polar-orbiting weather satellite were retrieved by a range of split window algorithms to obtain surface temperatures, which were used to construct a regression equation with minimum surface temperatures (MST) measured at a number of meteorological stations, with the retrievals and measurements corrected by a variational scheme to get gridded MST's. After comparison of errors from these algorithms the best one was selected for retrieving. By use of the retrieved temperatures re-corrected by the variational technique, injury indices and wheat conditions during its growth stages, the regional distribution was prepared of varying-degree cold injuries to the crop, with corresponding hit areas statistically calculated, thereby making it possible to sensings monitor the injuries and precisely determine areas hit by the varying-degree droughts.

Paper Details

Date Published: 31 July 2005
PDF: 9 pages
Proc. SPIE 5884, Remote Sensing and Modeling of Ecosystems for Sustainability II, 58841J (31 July 2005); doi: 10.1117/12.616586
Show Author Affiliations
Xuefen Zhang, Nanjing Univ. of Information Science and Technology (China)
Henan Institute of Meteorological Sciences (China)
Huailiang Chen, Henan Institute of Meteorological Sciences (China)
Chunhui Zou, Henan Institute of Meteorological Sciences (China)
Youfei Zheng, Nanjing Univ. of Information Science and Technology (China)
Shitao Wang, Henan Institute of Meteorological Sciences (China)
Dong Chen, Henan Institute of Meteorological Sciences (China)
Xiangjian Fu, Henan Institute of Meteorological Sciences (China)


Published in SPIE Proceedings Vol. 5884:
Remote Sensing and Modeling of Ecosystems for Sustainability II
Wei Gao; David R. Shaw, Editor(s)

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