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Proceedings Paper

Method of characteristic signatures matching through discrepancy-enhanced library generation process
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Paper Abstract

Scatterometry is an optical measurement technology based on the analysis of light scattered, or diffracted, from a periodic array of features. It is not an optical imaging technique, but rather a model-based metrology that determines measurement results by comparing measured light scatter against a model of theoretical scatter 'signatures'. Conventional algorithms take the average of the difference between the experimental and modeled signatures across the full detection range, and calculate a fitting quality score parameter for the fit, eg. as a RMSE (Root Mean Square Error), MSE (Mean Square Error) or SD (Square Distance). This study reports a novel method for efficiently and accurately determining grating profiles using characteristic signature matching in a discrepancy-enhanced library generation process. Using light scattering theory, such as rigorous coupled wave theory, a series of scattering signatures vs. scattering angles or wavelengths are generated based on the designed grating parameters, eg. CD (Critical Dimension), thickness and Line:Space ratio. This method selects characteristic portions of the signatures wherever their measurement sensitivity exceeds the preset criteria and reforms a characteristic signature library for quick and accurate matching. This method does not need to modify existing measurement hardware or the grating target. It saves a great percentage of storage memory in the computer system, and also increases the measurement sensitivity.

Paper Details

Date Published: 15 September 2005
PDF: 11 pages
Proc. SPIE 5908, Optical Information Systems III, 59081D (15 September 2005); doi: 10.1117/12.616383
Show Author Affiliations
Shih-Chun Wang, Industrial Technology Research Institute (Taiwan)
Yi-Sha Ku, Industrial Technology Research Institute (Taiwan)
Chun-Hung Ko, Industrial Technology Research Institute (Taiwan)
Nigel Smith, Accent Optical Technologies (Taiwan)


Published in SPIE Proceedings Vol. 5908:
Optical Information Systems III
Bahram Javidi; Demetri Psaltis, Editor(s)

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