Share Email Print
cover

Proceedings Paper

Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis
Author(s): Hiroki Nakano; Yumi Mori
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

One of the visual problems hardest to recognize in liquid crystal displays (LCDs) is an area of non-uniform brightness called a mura. The accurate and consistent detection of a low-contrast mura is extremely difficult because the boundary between the regional mura and the background is indistinct. This paper presents a novel method for detection and quantitative measurement of low-contrast mura. Compared with some wavelet approaches, the multiple resolution analysis method based on the Symmetric Selesnick multiwavelet has advantages for practical use.

Paper Details

Date Published: 19 August 2005
PDF: 6 pages
Proc. SPIE 5880, Optical Diagnostics, 588013 (19 August 2005); doi: 10.1117/12.616232
Show Author Affiliations
Hiroki Nakano, IBM Japan, Ltd. (Japan)
Yumi Mori, IBM Japan, Ltd. (Japan)


Published in SPIE Proceedings Vol. 5880:
Optical Diagnostics
Leonard M. Hanssen; Patrick V. Farrell, Editor(s)

© SPIE. Terms of Use
Back to Top