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Proceedings Paper

Detection of bus chassis flatness
Author(s): Chengzhi Su; Zhenhui Li
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Proc. SPIE 5881, Infrared and Photoelectronic Imagers and Detector Devices, 58810Z; doi: 10.1117/12.615812
Show Author Affiliations
Chengzhi Su, Changchun Univ. of Science and Technology (China)
Zhenhui Li, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 5881:
Infrared and Photoelectronic Imagers and Detector Devices
Randolph E. Longshore, Editor(s)

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