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Proceedings Paper

Submicron particle localization using evanescent field
Author(s): Martin Siler; Mojmir Sery; Tomas Cizmar; Pavel Zemanek
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Paper Abstract

Recently a non-contact organization of submicron colloidal particles on the surface attracted a great attention in connection with development of imaging techniques using total internal reflection. We focus here on the theoretical description of the forces acting on a submicron particle placed in an interference field created by two counter-propagating evanescent waves. Numerical results elucidate how these forces or trap depth depend on the particle size and angle of incidence of both beams. Experimental results proved these conclusions and several polystyrene particles of diameter 520 nm were confined in evanescent standing wave.

Paper Details

Date Published: 26 August 2005
PDF: 9 pages
Proc. SPIE 5930, Optical Trapping and Optical Micromanipulation II, 59300R (26 August 2005); doi: 10.1117/12.615741
Show Author Affiliations
Martin Siler, Institute of Scientific Instruments (Czech Republic)
Mojmir Sery, Institute of Scientific Instruments (Czech Republic)
Tomas Cizmar, Institute of Scientific Instruments (Czech Republic)
Pavel Zemanek, Institute of Scientific Instruments (Czech Republic)


Published in SPIE Proceedings Vol. 5930:
Optical Trapping and Optical Micromanipulation II
Kishan Dholakia; Gabriel C. Spalding, Editor(s)

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