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Proceedings Paper

Angular and spectroscopic ellipsometry of ion bombarded surface layer
Author(s): L. V. Poperenko; P. B. Kosel; M. V. Vinnichenko
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Paper Abstract

The results were analyzed and systematized and approaches were elaborated to nondestructive monitoring of the surface ion modification. The damage profiles were simulated for metals (Cu, Al, Mo, stainless steel) being irradiated by different ions (H+/D+, Ar+, metal ions) within wide energy range (E=1 keV - 1 MeV). Optical properties of mono-, polycrystalline and amorphous materials were studied by means of angular (wavelength λ=632.8 nm) and spectral ellipsometry (probing photons energy range 0.05-5 eV). The surface of metals were also probed by Auger electron spectroscopy, scanning electron microscopy and atomic force microscopy. As a result of IR ellipsometric studies it has been revealed that treatment of the polycrystalline Ti surface by the mixed Ti+ and C+ ion beam caused much stronger changes of its subsurface optical properties that treatment of polycrystalline Mo by the same ion beam, because the bombarding ions (Ti+) have an affinity with Ti surface atoms. The treatment resulted in formation on Ti surface disordered layer with non-Drude-like behavior of the optical properties. Irradiation of Mo surface by the same ion beam induced the changes of free electron scattering mechanism while optical conductivity remains Drude-like.

Paper Details

Date Published: 25 August 2005
PDF: 12 pages
Proc. SPIE 5870, Advances in Thin-Film Coatings for Optical Applications II, 58700K (25 August 2005); doi: 10.1117/12.615683
Show Author Affiliations
L. V. Poperenko, National Taras Shevchenko Univ. of Kyiv (Ukraine)
P. B. Kosel, Univ. of Cincinnati (United States)
M. V. Vinnichenko, National Taras Shevchenko Univ. of Kyiv (Ukraine)

Published in SPIE Proceedings Vol. 5870:
Advances in Thin-Film Coatings for Optical Applications II
Michael L. Fulton; Jennifer D. T. Kruschwitz, Editor(s)

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