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Proceedings Paper

Technology development for the Constellation-X spectroscopy x-ray telescope
Author(s): Robert Petre; John Lehan; Stephen O'Dell; Scott Owens; Paul B. Reid; Timo Saha; Jeff Stewart; William D. Jones; Wiiliam Zhang
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Paper Abstract

The Constellation-X Spectroscopy X-ray Telescope (SXT) is a large diameter, high throughput, grazing incidence imaging mirror system, designed to perform high sensitivity spectroscopy of cosmic X-ray sources in the 0.2-10.0 keV band. The baseline effective area requirement is ~3 m2 at 1 keV. The system-level angular-resolution requirement is a 15-arcseconds half-power diameter, with a 5-arcsecond goal. The effective area is attained through a modular design, involving the nesting of many confocal, thin-walled Wolter I mirror segments. Considerable progress has been made in developing thin, thermally formed, glass mirror substrates that meet or better the angular-resolution requirement. Several approaches to mounting and aligning reflector segments into a mirror system are under investigation. We report here on the progress of the SXT technology development program toward reaching the performance goals.

Paper Details

Date Published: 8 September 2005
PDF: 8 pages
Proc. SPIE 5900, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II, 59000U (8 September 2005); doi: 10.1117/12.615172
Show Author Affiliations
Robert Petre, NASA Goddard Space Flight Ctr. (United States)
John Lehan, NASA Goddard Space Flight Ctr. (United States)
Stephen O'Dell, Universities Space Research Association (United States)
Scott Owens, NASA Marshall Space Flight Ctr. (United States)
Paul B. Reid, Smithsonian Astrophysical Observatory (United States)
Timo Saha, NASA Marshall Space Flight Ctr. (United States)
Jeff Stewart, NASA Goddard Space Flight Ctr. (United States)
William D. Jones, Universities Space Research Association (United States)
Wiiliam Zhang, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 5900:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy II
Oberto Citterio; Stephen L. O'Dell, Editor(s)

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