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Proceedings Paper

A refractive imaging system for the characterization of x-ray sources
Author(s): C. K. Gary; D. E. Doggett; H. Park; J. L. Harris; S. A. Pikuz; M. D Mitchell; K. M Chandler; T. A. Shelkovenko; D. A. Hammer
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Paper Abstract

We present a system for diagnostic imaging of x-ray sources using a compound refractive lens. Such a system can be built at a low cost, yet image at resolutions of 2 μm or better. The essential components of the system are the source to be imaged, a compound refractive lens and imaging detector (either electronic or film). In addition, spatial and spectral filters can be added to improve resolution and a laser alignment system can be used to rapidly align the source, lens and camera.

Paper Details

Date Published: 12 September 2005
PDF: 8 pages
Proc. SPIE 5918, Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II, 591812 (12 September 2005); doi: 10.1117/12.615059
Show Author Affiliations
C. K. Gary, Adelphi Technology, Inc. (United States)
D. E. Doggett, Adelphi Technology, Inc. (United States)
H. Park, Adelphi Technology, Inc. (United States)
J. L. Harris, Adelphi Technology, Inc. (United States)
S. A. Pikuz, Cornell Univ. (United States)
M. D Mitchell, Cornell Univ. (United States)
K. M Chandler, Cornell Univ. (United States)
T. A. Shelkovenko, Cornell Univ. (United States)
D. A. Hammer, Cornell Univ. (United States)


Published in SPIE Proceedings Vol. 5918:
Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II
George A. Kyrala; Jean-Claude J. Gauthier; Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

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