Share Email Print
cover

Proceedings Paper

Noise and spectroscopic performance of DEPMOSFET matrix devices for XEUS
Author(s): J. Treis; P. Fischer; O. Hälker; S. Herrmann; R. Kohrs; H. Krüger; P. Lechner; G. Lutz; I. Peric; M. Porro; R. H. Richter; L. Strüder; M. Trimpl; N. Wermes; S. Wölfel
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

DEPMOSFET based Active Pixel Sensor (APS) matrix devices, originally developed to cope with the challenging requirements of the XEUS Wide Field Imager, have proven to be a promising new imager concept for a variety of future X-ray imaging and spectroscopy missions like Simbol-X. The devices combine excellent energy resolution, high speed readout and low power consumption with the attractive feature of random accessibility of pixels. A production of sensor prototypes with 64 x 64 pixels with a size of 75 μm x 75 μm each has recently been finished at the MPI semiconductor laboratory in Munich. The devices are built for row-wise readout and require dedicated control and signal processing electronics of the CAMEX type, which is integrated together with the sensor onto a readout hybrid. A number of hybrids incorporating the most promising sensor design variants has been built, and their performance has been studied in detail. A spectroscopic resolution of 131 eV has been measured, the readout noise is as low as 3.5 e- ENC. Here, the dependence of readout noise and spectroscopic resolution on the device temperature is presented.

Paper Details

Date Published: 18 August 2005
PDF: 11 pages
Proc. SPIE 5898, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV, 58980X (18 August 2005); doi: 10.1117/12.614894
Show Author Affiliations
J. Treis, Max-Planck-Institut für extraterrestrische Physik (Germany)
P. Fischer, Univ. Mannheim (Germany)
O. Hälker, Max-Planck-Institut für extraterrestrische Physik (Germany)
S. Herrmann, Max-Planck-Institut für extraterrestrische Physik (Germany)
R. Kohrs, Univ. Bonn (Germany)
H. Krüger, Univ. Bonn (Germany)
P. Lechner, PNSensor GmbH (Germany)
G. Lutz, Max-Planck-Institut für Physik (Germany)
I. Peric, Univ. Mannheim (Germany)
M. Porro, Politecnico di Milano (Italy)
R. H. Richter, Max-Planck-Institut für Physik (Germany)
L. Strüder, Max-Planck-Institut für extraterrestrische Physik (Germany)
M. Trimpl, Univ. Bonn (Germany)
N. Wermes, Univ. Bonn (Germany)
S. Wölfel, Max-Planck-Institut für extraterrestrische Physik (Germany)


Published in SPIE Proceedings Vol. 5898:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV
Oswald H. W. Siegmund, Editor(s)

© SPIE. Terms of Use
Back to Top