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Proceedings Paper

Characterization of drop-on-demand printed conductive silver tracks
Author(s): Hendrik Rothe; Anna Usbeck; Dominik Cibis; Klaus Krueger
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Paper Abstract

Thick-film technology is a generally known method for the production of high-end electronic circuit units. The corresponding active electric layers are applied by screen-printing today. The inkjet-printing principle may present an alternative for the future. Aim at the Professorship for Data Processing is the development of such a printing process. Experimental basis is a piezo-driven drop-on-demand (DoD) micro feeding system and a colloidal silver ink. Both, feeding system and ink have to be developed. The ink consists of a solvent (dispersion medium), a dispersing additive and silver and glass particles. Mean particle diameters between 0.2 and 2.5 micrometers are under consideration. One main task is to achieve a homogeneous distribution of the particles on the printed surface. Therefore, the surface of single splashed drops has to be analyzed. Analysis is supported by the Laboratory of Measurement and Information Technology. To characterize a single printed drop with a diameter of about 200 μm every particle has to be seen. Therefore the resolution of an atomic force microscope with the working area of a white light interferometer is necessary. Measurements have been carried out with the Nanometre Coordinate Measuring Machine (NCMM) developed at the Laboratory of Measurement and Information Technology. The NCMM is equipped with an atomic force microscope as a probe and has a working volume of 10 mm x 10 mm x 5 mm. The resolution of the interferometers used is 1.24 nm.

Paper Details

Date Published: 31 August 2005
PDF: 10 pages
Proc. SPIE 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, 587812 (31 August 2005); doi: 10.1117/12.614861
Show Author Affiliations
Hendrik Rothe, Helmut-Schmidt-Univ. (Germany)
Anna Usbeck, Helmut-Schmidt-Univ. (Germany)
Dominik Cibis, Helmut-Schmidt-Univ. (Germany)
Klaus Krueger, Helmut-Schmidt-Univ. (Germany)

Published in SPIE Proceedings Vol. 5878:
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
Angela Duparre; Bhanwar Singh; Zu-Han Gu, Editor(s)

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