Share Email Print

Proceedings Paper

Myriad-based shift parameter estimation method and its application to image filtering and processing
Author(s): Vladimir V. Lukin; Sergey K. Abramov; Alexander A. Zelensky; Jaakko T. Astola
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

One typical problem in image processing is to remove noise. This problem becomes rather complicated if not one type of noise is present, i.e. if, for example, an image is corrupted by mixed noise. Non-adaptive nonlinear filters often do not provide desirable image processing quality. Nonlinear locally adaptive hard-switching filters are more flexible and effi-cient in this sense. However, for mixed noise case, all component filters employed in locally adaptive filtering (LAF) framework have to possess robust properties. In particular, this relates to the so-called noise suppressing filter (NSF) to be applied in image homogeneous regions. Below we show that myriad filter with properly selected tunable (lineariza-tion) parameter is able to be an efficient NSF that outperforms well known α-trimmed and Wilcoxon filters. For this purpose, general statistical analysis for myriad estimate of distribution shift (location) parameter is performed first. Then numerical simulation results for myriad estimator are obtained and compared to other robust shift parameter estimators for different parameters of data sample model used. The recommendations for tunable parameter selection are given. The proposed filtering technique is verified for both artificial and real images.

Paper Details

Date Published: 30 August 2005
PDF: 12 pages
Proc. SPIE 5916, Mathematical Methods in Pattern and Image Analysis, 591601 (30 August 2005); doi: 10.1117/12.614829
Show Author Affiliations
Vladimir V. Lukin, National Aerospace Univ. (Ukraine)
Sergey K. Abramov, National Aerospace Univ. (Ukraine)
Alexander A. Zelensky, National Aerospace Univ. (Ukraine)
Jaakko T. Astola, Tampere Univ. of Technology (Finland)

Published in SPIE Proceedings Vol. 5916:
Mathematical Methods in Pattern and Image Analysis
Jaakko T. Astola; Ioan Tabus; Junior Barrera, Editor(s)

© SPIE. Terms of Use
Back to Top