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Proceedings Paper

Characterization laboratories for LIL and LMJ ultrafast detectors
Author(s): T. Caillaud; S. Hubert; M. Mangeant; V. Prevot; J. Ribolzi; D. Desenne
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Paper Abstract

Streak cameras and framing cameras used for studying single shot laser created plasmas at LIL and soon at LMJ need to be regularly controlled to assure a good operating system. This poster presents the laboratories that have been set up at CEA-CESTA to overcome this task. To cover the entire spectral domain required, many sources have been designed. First, AZUR laboratory is supposed to deliver three measurements ways equipped with laser sources for static and dynamic visible detectors control. Second, CADENCE laboratory is ought to test temporal resolution in UV domain by delivering laser ps pulse train. X-ray cameras are then calibrated by replacing CsI photocathodes with Pd photocathodes sensitive in UV. Finally, STATIX laboratory aims at controlling X-ray streak and framing cameras in static regime with several continuous X-ray sources. Properties as linearity, homogeneity, sensitivity and temporal response are going to be measured to guaranty diagnostics performances on LIL plasma physics shots.

Paper Details

Date Published: 21 September 2005
PDF: 5 pages
Proc. SPIE 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications, 592016 (21 September 2005); doi: 10.1117/12.614817
Show Author Affiliations
T. Caillaud, Ctr. d'Etudes Scientifiques et Techniques d'Aquitaine, CEA (France)
S. Hubert, Ctr. d'Etudes Scientifiques et Techniques d'Aquitaine, CEA (France)
M. Mangeant, Ctr. d'Etudes Scientifiques et Techniques d'Aquitaine, CEA (France)
V. Prevot, Ctr. d'Etudes Scientifiques et Techniques d'Aquitaine, CEA (France)
J. Ribolzi, Ctr. d'Etudes Scientifiques et Techniques d'Aquitaine, CEA (France)
D. Desenne, Ctr. d'Etudes Scientifiques et Techniques d'Aquitaine, CEA (France)


Published in SPIE Proceedings Vol. 5920:
Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
Zenghu Chang; Jean-Claude Kieffer; Jerome B. Hastings; Stuart Kleinfelder; Dennis L. Paisley, Editor(s)

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