Share Email Print

Proceedings Paper

Design and calibration of an elastically guided CMM axis with nanometer repeatability
Author(s): J. K. van Seggelen; P. C.J.N. Rosielle; P. H. J. Schellekens; H. A.M. Spaan; R. H. Bergmans; G. J. W. L. Kotte
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper focuses on the on the design and calibration of an elastically guided vertical axis that will be applied in a small high precision 3D Coordinate Measuring Machine aiming a volumetric uncertainty of 25 nm. The design part of this paper discusses the principles of this system, the compensation of the stiffness of the vertical axis in the direction of motion, the weight compensation method and the design and performance of the axis precision drive system, a Lorentz actuator. In the metrology part of this paper the calibration methods to determine the linearity as well as motion straightness and axis rotation errors are discussed. Finally first calibration results of this axis show nanometer repeatability of the probing point over the 4 mm stroke of this axis. The causes of the short-term variations with a bandwidth of about ± 10 nm are under investigation. Error compensation may reduce the residual error of the probing point to the nanometer level.

Paper Details

Date Published: 18 August 2005
PDF: 8 pages
Proc. SPIE 5879, Recent Developments in Traceable Dimensional Measurements III, 58790T (18 August 2005); doi: 10.1117/12.614321
Show Author Affiliations
J. K. van Seggelen, Technische Univ. Eindhoven (Netherlands)
P. C.J.N. Rosielle, Technische Univ. Eindhoven (Netherlands)
P. H. J. Schellekens, Technische Univ. Eindhoven (Netherlands)
H. A.M. Spaan, IBS Precision Engineering BV (Netherlands)
R. H. Bergmans, NMi Van Swinden Laboratorium (Netherlands)
G. J. W. L. Kotte, NMi Van Swinden Laboratorium (Netherlands)

Published in SPIE Proceedings Vol. 5879:
Recent Developments in Traceable Dimensional Measurements III
Jennifer E. Decker; Gwo-Sheng Peng, Editor(s)

© SPIE. Terms of Use
Back to Top