Share Email Print
cover

Proceedings Paper

Optical design and requirements for the normal incidence x-ray telescope of the Reconnection and Microscale Solar Probe
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

One of the key instruments on the Reconnection and Microscale (RAM) Solar-Terrestrial Probe mission is a normal incidence multilayer x-ray telescope designed to provide 10 milli-arc-sec imaging of the solar corona. To achieve this level of imaging it will be necessary to fabricate meter-class reflective optics with diffraction limited performance at 193 Angstroms. Because of the use of multilayer optics, surface micro-roughness must also be maintained at very low levels (a few Angstroms rms) to maintain good reflectance. To ease fabrication constraints and the sometimes competing requirements of micro-roughness and figure, we have explored a number of potential designs and fabrication approaches for RAM. Figure error budgets and optical designs are shown, demonstrating that RAM can be built with existing mirror fabrication technology.

Paper Details

Date Published: 31 August 2005
PDF: 8 pages
Proc. SPIE 5900, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II, 59000K (31 August 2005); doi: 10.1117/12.613951
Show Author Affiliations
Paul B. Reid, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Paul Glenn, Bauer Associates (United States)
Jay Bookbinder, Harvard-Smithsonian Ctr. for Astrophysics (United States)


Published in SPIE Proceedings Vol. 5900:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy II
Oberto Citterio; Stephen L. O'Dell, Editor(s)

© SPIE. Terms of Use
Back to Top