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Proceedings Paper

Specific photometer for large coated optics
Author(s): Gael Gaborit; Eric Lavastre; Isabelle Lebeaux; Jean-Christophe Poncetta
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Paper Abstract

This paper presents an overview of a photometer developed by CEA to characterize large coated optics (up to 800 x 400 mm2).

Paper Details

Date Published: 31 August 2005
PDF: 10 pages
Proc. SPIE 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, 58781A (31 August 2005); doi: 10.1117/12.613900
Show Author Affiliations
Gael Gaborit, Commissariat a l'Energie Atomique (France)
Eric Lavastre, Commissariat a l'Energie Atomique (France)
Isabelle Lebeaux, Commissariat a l'Energie Atomique (France)
Jean-Christophe Poncetta, Commissariat a l'Energie Atomique (France)


Published in SPIE Proceedings Vol. 5878:
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
Angela Duparre; Bhanwar Singh; Zu-Han Gu, Editor(s)

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