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Proceedings Paper

A friction induced impulse noise detection of a PDP TV by using the double pulse ESPI
Author(s): Jae Hyuk Lee; Sun Il Ham; Sang Deuk Park
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Paper Abstract

A friction induced impulse noise of a plasma display panel (PDP) TV caused by a stick-slip phenomenon can be characterized as a single pulse sound or a burst sound with a duration time between 0.001 and 1 second, which can be occurred in all of constrained places such as screwed points or touching surfaces of two panels due to sudden temperature changes of a product. It is desired to find the source of noise in order to reduce magnitude and frequency, however, it is very difficult thing because of unexpected occurrence and short duration. This paper shows the technique to detect the source of a noise by using the Double Pulse Electronic Speckle Pattern Interferometry (ESPI) and the Laser Doppler Vibrometer (LDV). The double pulse ESPI can be well applied for a measurement of a dynamic deformation because it is able to catch a source of noise by observing the deformation field of a part caused by instantaneous slip in an instant of a emission of accumulated thermal energy in screwed points and touching surfaces. For a measurement of a microscopic deformation by a frictional surface slip occurred in a short duration within 100us, spatial phase shift method which works well for high speed application such as a deformation by a shock was used in double pulse ESPI. The firing signal of pulse ESPI can be received by triggering the impulse magnitude at a moment of a slip. Pulse ESPI can catch the deformation by a minute slip at a moment of noise, which contributed greatly to reduction of frictional noises in PDP TV.

Paper Details

Date Published: 18 August 2005
PDF: 8 pages
Proc. SPIE 5880, Optical Diagnostics, 588016 (18 August 2005); doi: 10.1117/12.613798
Show Author Affiliations
Jae Hyuk Lee, Samsung Electronics (South Korea)
Sun Il Ham, Samsung Electronics (South Korea)
Sang Deuk Park, Samsung Electronics (South Korea)


Published in SPIE Proceedings Vol. 5880:
Optical Diagnostics
Leonard M. Hanssen; Patrick V. Farrell, Editor(s)

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