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Proceedings Paper

CdTe ceramics based on compression of the nanocrystal powder
Author(s): N. N. Kolesnikov; E. B. Borisenko; D. N. Borisenko; R. B. James; V. V. Kveder; V. K. Gartman; B. A. Gnesin
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Paper Abstract

Wide-gap II-VI semiconductor crystalline materials are conventionally used in laser optics, light emitting devices, and nuclear detectors. The advances made in the studies of nanocrystals and in the associated technologies have created great interest in the design of semiconductor devices based on these new materials. The objectives of this work are to study the microstructure and the properties of the new material produced through CdTe nanopowder compression and to consider the prospects of its use in the design of ionizing-radiation detectors and in laser optics. Highly dense material produced of 7-10 nm CdTe particles under pressure of 20-600 MPa at temperatures from 20 to 200°C was analyzed using x-ray diffractometry, texture analysis, light and scanning electron microscopy, and optical spectrophotometry. The mechanical and electrical properties of the compacted material were measured and compared with similar characteristics of the conventionally grown single crystals. Phase transformation from metastable to stable crystal structure caused by deformation was observed in the material. Sharp crystallographic texture {001} that apparently affects specific mechanical, electrical and optical characteristics of compacted CdTe was observed. The specific resistivity calculated from the linear current-voltage characteristics was about 1010 Ohm×cm, which is aapromisingly high value regarding the possibility of using this material in the design of semiconductor radiation detectors. The optical spectra show that the transmittance in the infrared region is sufficient to consider the prospects of possible applications of CdTe ceramics in laser optics.

Paper Details

Date Published: 22 September 2005
PDF: 5 pages
Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 59220V (22 September 2005); doi: 10.1117/12.613099
Show Author Affiliations
N. N. Kolesnikov, The Russian Academy of Sciences (Russia)
E. B. Borisenko, The Russian Academy of Sciences (Russia)
D. N. Borisenko, The Russian Academy of Sciences (Russia)
R. B. James, Brookhaven National Lab. (United States)
V. V. Kveder, The Russian Academy of Sciences (Russia)
V. K. Gartman, The Russian Academy of Sciences (Russia)
B. A. Gnesin, The Russian Academy of Sciences (Russia)

Published in SPIE Proceedings Vol. 5922:
Hard X-Ray and Gamma-Ray Detector Physics VII
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

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