Share Email Print
cover

Proceedings Paper

Combatting infrared focal plane array nonuniformity noise in imaging polarimeters
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

One of the most significant challenges in performing infrared (IR) polarimetery is the focal plane array (FPA) nonuniformity (NU) noise that is inherent in virtually all IR photodetector technologies that operate in the midwave IR (MWIR) or long-wave IR (LWIR). NU noise results from pixel-to-pixel variations in the repsonsivity of the photodetectors. This problem is especially severy in the microengineered IR FPA materials like HgCdTe and InSb, as well as in uncooled IR microbolometer sensors. Such problems are largely absent from Si based visible spectrum FPAs. The pixel response is usually a variable nonlinear response function, and even when the response is linearized over some range of temperatures, the gain and offset of the resulting response is usually highly variable. NU noise is normally corrected by applying a linear calibration to the data, but the resulting imagery still retains residual nonuniformity due to the nonlinearity of the photodetector responses. This residual nonuniformity is particularly troublesome for polarimeters because of the addition and subtraction operations that must be performed on the images in order to construct the Stokes parameters or other polarization products. In this paper we explore the impact of NU noise on full stokes and linear-polarization-only IR polarimeters. We compare the performance of division of time, division of amplitude, and division of array polarimeters in the presence of both NU and temporal noise, and assess the ability of calibration-based NU correction schemes to clean up the data.

Paper Details

Date Published: 18 August 2005
PDF: 10 pages
Proc. SPIE 5888, Polarization Science and Remote Sensing II, 58880J (18 August 2005); doi: 10.1117/12.613075
Show Author Affiliations
Bradley M. Ratliff, Applied Technology Associates (United States)
Rakesh Kumar, Univ. of New Mexico (United States)
Wiley Black, Applied Technology Associates (United States)
James K. Boger, Applied Technology Associates (United States)
Univ. of New Mexico (United States)
J. Scott Tyo, Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. 5888:
Polarization Science and Remote Sensing II
Joseph A. Shaw; J. Scott Tyo, Editor(s)

© SPIE. Terms of Use
Back to Top