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Proceedings Paper

Material parameter extraction for terahertz time-domain spectroscopy using fixed-point iteration
Author(s): W. Withayachumnankul; B. Ferguson; T. Rainsford; S. P. Mickan; D. Abbott
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Paper Abstract

A simple method to extract the far-infrared dielectric parameters of a homogeneous material from terahertz signals is explored in this paper. Provided with a reference, sample-probing terahertz signal and a known sample thickness, the method can determine the underlying complex refractive index of the sample within a few iterations based on the technique of fixed-point iteration. The iterative process is guaranteed to converge and gives the correct parameters when the material thickness exceeds 200 μm at a frequency of 0.1 THz or 20 μm at a frequency of 1.0 THz.

Paper Details

Date Published: 7 July 2005
PDF: 11 pages
Proc. SPIE 5840, Photonic Materials, Devices, and Applications, (7 July 2005); doi: 10.1117/12.612946
Show Author Affiliations
W. Withayachumnankul, The Univ. of Adelaide (Australia)
B. Ferguson, The Univ. of Adelaide (Australia)
T. Rainsford, The Univ. of Adelaide (Australia)
S. P. Mickan, The Univ. of Adelaide (Australia)
D. Abbott, The Univ. of Adelaide (Australia)

Published in SPIE Proceedings Vol. 5840:
Photonic Materials, Devices, and Applications
Goncal Badenes; Derek Abbott; Ali Serpenguzel, Editor(s)

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