Share Email Print

Proceedings Paper

Comparison of B-spline and Zernike fitting techniques in complex wavefront surfaces
Author(s): M. Ares; S. Royo; J. Caum; C. Pizarro
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Zernike polynomial fitting has been the commonplace alternative for assigning a measured wavefront a given shape. However, Zernike polynomials have intrinsic limitations under given conditions, mainly in complex wavefronts with for instance decentered double-peaks or with relevant undulations. The main goal of this paper is analyzing an alternative to Zernike fitting based in B-Spline fitting, comparing the strengths and weaknesses of each representation when applied to wavefront fitting. Simple and complex wavefront cases will be presented and studied, and the quality of their fitted representations using Zernike and B-Spline polynomials will be compared, presenting the main factors relevant in their comparison. Moreover, the case of random white noise added to the estimated data will allow an insight into the expected behavior of both representations when applied to experimental data.

Paper Details

Date Published: 13 June 2005
PDF: 10 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612726
Show Author Affiliations
M. Ares, Technical Univ. of Catalunya (Spain)
S. Royo, Technical Univ. of Catalunya (Spain)
J. Caum, Technical Univ. of Catalunya (Spain)
C. Pizarro, Technical Univ. of Catalunya (Spain)

Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top