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Proceedings Paper

Submicroradian accuracy scanning system with a double-wedge rotating around the orthogonal axes
Author(s): Anhu Li; Jianfeng Sun; Lijuan Wang; Liren Liu
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Paper Abstract

A scanning system of a high accuracy double-wedge is presented, which allows us to perform very small angle deviation of a passing beam in a simple way. The first wedge's principal section is perpendicular to the horizontal axis, and the second is to the vertical axis correspondingly. They respectively rotate around the horizontal axis and the vertical axis as they work. So different small rotation angles of two wedges determine the corresponding orientation and position of the passing beam, and then high accuracy and very small-angle beam deviation can be performed. According to the design result: when the wedge angle is 5°, the refraction light beam will change about 1μrad if the wedge is rotated 1arcmin; the scanning range of light beam in the horizontal direction and the vertical direction can be not less than 600μrad, and the scanning precision of the device can be superior to 0.2 micro μrad

Paper Details

Date Published: 12 September 2005
PDF: 8 pages
Proc. SPIE 5892, Free-Space Laser Communications V, 58921M (12 September 2005); doi: 10.1117/12.612669
Show Author Affiliations
Anhu Li, Shanghai Institute of Optics and Fine Mechanics, CAS (China)
Jianfeng Sun, Shanghai Institute of Optics and Fine Mechanics, CAS (China)
Lijuan Wang, Shanghai Institute of Optics and Fine Mechanics, CAS (China)
Liren Liu, Shanghai Institute of Optics and Fine Mechanics, CAS (China)


Published in SPIE Proceedings Vol. 5892:
Free-Space Laser Communications V
David G. Voelz; Jennifer C. Ricklin, Editor(s)

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