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Proceedings Paper

A new approach for measurement of wire diameter by optical diffraction
Author(s): Yogesh C. Diwan; Kameswara Rao Lolla
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Paper Abstract

A new approach for measurement of wire diameter lying in the range of 200 to 450 microns is proposed and demonstrated. The approach is based on evaluation of phase-correlation based similarity measure for two identical order fringes of a diffraction pattern. Diameter of wires is estimated by determining separation between identical order fringes. Robustness of the approach to noise is enhanced by using Gaussian and singular value decomposition based filtering. Implementation of the method with an off-the-shelf digital photo camera for acquiring experimental data from steel wires and thin slits have demonstrated an accuracy far better than 0.5% of dimension.

Paper Details

Date Published: 13 June 2005
PDF: 8 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612649
Show Author Affiliations
Yogesh C. Diwan, Indian Institute of Science (India)
Kameswara Rao Lolla, Indian Institute of Science (India)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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