Share Email Print

Proceedings Paper

Polarimetry: measurements, error analysis, and application
Author(s): C. Flueraru; X. Cai; S. Chang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A simple polarimeter based upon a quarter wave plate and a polarizer is presented. Rotating the quarter wave plate all Stokes vector components are calculated by processing the intensity variation. The effect of misalignment in the linear polarizer azimuth and the deviation from the π/2 retardance of the quarter wave plate is analytical and experimental investigated. The technique is consolidated by using two algorithms for Stokes vector calculation.

Paper Details

Date Published: 26 August 2005
PDF: 9 pages
Proc. SPIE 5858, Nano- and Micro-Metrology, 58580H (26 August 2005); doi: 10.1117/12.612648
Show Author Affiliations
C. Flueraru, Institute for Microstructural Science, NRC (Canada)
X. Cai, Institute for Microstructural Science, NRC (Canada)
S. Chang, Institute for Microstructural Science, NRC (Canada)

Published in SPIE Proceedings Vol. 5858:
Nano- and Micro-Metrology
Heidi Ottevaere; Peter DeWolf; Diederik S. Wiersma, Editor(s)

© SPIE. Terms of Use
Back to Top