Share Email Print
cover

Proceedings Paper

A new approach for simple and rapid shape measurement of objects with surface discontinuities
Author(s): Sai Siva Gorthi; Kameswara Rao Lolla
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A new approach for unwrapping phase maps, obtained during the measurement of 3-D surfaces using sinusoidal structured light projection technique, is proposed. “Takeda's method” is used to obtain the wrapped phase map. Proposed method of unwrapping makes use of an additional image of the object captured under the illumination of a specifically designed color-coded pattern. The new approach demonstrates, for the first time, a method of producing reliable unwrapping of objects even with surface discontinuities from a single-phase map. It is shown to be significantly faster and reliable than temporal phase unwrapping procedure that uses a complete exponential sequence. For example, if a measurement with the accuracy obtained by interrogating the object with S fringes in the projected pattern is carried out with both the methods, new method requires only 2 frames as compared to (log2S +1) frames required by the later method.

Paper Details

Date Published: 13 June 2005
PDF: 11 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612620
Show Author Affiliations
Sai Siva Gorthi, Indian Institute of Science (India)
Kameswara Rao Lolla, Indian Institute of Science (India)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top