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Proceedings Paper

Utilizing a TII aspherical measurement machine in a computer controlled polishing process
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Paper Abstract

The demand on quality of optical surfaces is increasing from year to year. Computer controlled polishing is one way to fulfill these demands. The process depends on the error-profile of the optical surface. In this paper the usage of the TII measurement machine is discussed to manufacture optical surfaces.

Paper Details

Date Published: 13 June 2005
PDF: 7 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612597
Show Author Affiliations
E. Pitschke, Univ. of Applied Sciences Deggendorf (Germany)
M. Schinhaerl, Univ. of Applied Sciences Deggendorf (Germany)
P. Sperber, Univ. of Applied Sciences Deggendorf (Germany)
R. Rascher, Univ. of Applied Sciences Deggendorf (Germany)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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