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Proceedings Paper

Reflectivity function based illumination and sensor planning for industrial inspection
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Paper Abstract

In this paper, we will derive a phenomenological model of the bidirectional reflectance distribution function of non-Lambertian metallic materials typically used in industrial inspection. We will show, how the model can be fitted to measured reflectance values and how the fitted model can be used to determine a suitable illumination position. Together with a given sensor pose, this illumination position can be used to calculate the necessary shutter time, aperture, focus setting and expected gray value to successfully perform a given visual inspection task. The paper concludes with several example inspection tasks.

Paper Details

Date Published: 13 June 2005
PDF: 10 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612547
Show Author Affiliations
Marc M. Ellenrieder, DaimlerChrysler AG (Germany)
Christian Wohler, DaimlerChrysler AG (Germany)
Pablo d'Angelo, DaimlerChrysler AG (Germany)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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