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Proceedings Paper

Portable interference device for roughness measurement
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Paper Abstract

The relationship between statistical structure parameters of rough surface and associated correlation parameters of scattered field is used to develop a method for rough surface diagnostics. The treatment is based on the model of random phase object with inhomogeneity phase variation less than unit. The proposed diagnostic method is applicable to arbitrarily shaped surfaces. The sensitivity limit of the method in measuring the standard deviation of surface profile from base line is about 0.001 μm.

Paper Details

Date Published: 26 August 2005
PDF: 10 pages
Proc. SPIE 5858, Nano- and Micro-Metrology, 58580L (26 August 2005); doi: 10.1117/12.612533
Show Author Affiliations
Oleg V. Angelsky, Chernivtsy Univ. (Ukraine)
Peter P. Maksimyak, Chernivtsy Univ. (Ukraine)


Published in SPIE Proceedings Vol. 5858:
Nano- and Micro-Metrology
Heidi Ottevaere; Peter DeWolf; Diederik S. Wiersma, Editor(s)

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