Share Email Print

Proceedings Paper

Grid-pattern design for fast scene reconstruction by a 3D vision sensor
Author(s): Qiu Guan; ShengYong Chen; Wanliang Wang; Y. F. Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper presents a method of pattern design for a 3D vision sensor, which is based on the principles of color-encoded structured light, to improve the reconstruction efficiency. Since an ordinary structured light system using an LCD projector needs to take several images (usually 8-12 images) for recovering the 3D scene, as a result its speed is limited and applications are restricted in acquisition of static environment. For dynamic cases, the 3D measurement is desired to only capture a single image. To realize this, a new method is to use a color projector which can be controlled by a computer to generate arbitrary desired color patterns. A problem of the color encoded projection is the unique indexing of the light codes in the image. It is essential that each light grid be uniquely identified by incorporating the local neighborhoods in the light pattern so that 3D reconstruction can be performed with only local analysis of the single image. This paper proposes a method in design of such grid patterns. Experiments are provided to demonstrate the proposed method with two, three, and four different colors. The maximum possible square matrices are illustrated.

Paper Details

Date Published: 13 June 2005
PDF: 9 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612494
Show Author Affiliations
Qiu Guan, Zhejiang Univ. of Technology (China)
ShengYong Chen, Zhejiang Univ. of Technology (China)
Institute of Automation, CAS (China)
Wanliang Wang, Zhejiang Univ. of Technology (China)
Y. F. Li, City Univ. of Hong Kong (Hong Kong China)

Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top