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Proceedings Paper

A method for measuring the complex refractive index of a turbid medium
Author(s): Zhi-Cheng Jian; Jiun-You Lin; Po-Jen Hsieh; Huei-Wen Chen; Der-Chin Su
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Paper Abstract

Based on the heterodyne interferometry and Fresnel equations, an alternative method for measuring the complex refractive index of a turbid medium. A light beam is incident on the boundary between a right-angle prism and a turbid medium. The phase difference between s- and p- polarizations of the reflected light occurs. The phase difference depends on then incident angle and the complex refractive index of a turbid medium; their relation can be derived from Fresnel equations. The phase difference can be measured accurately with the heterodyne interferometry. Because there are two unknown parameters to be estimated, at least the phase differences under two different conditions should be measured. Then, these measured data are substituted into the derived relation, and a set simultaneous equation is obtained. If the simultaneous equation is solved, the complex refractive index can be estimated. Because the reflected light from the boundary is measured, the scattering noises coming from the turbidity of the tested medium can be greatly reduced. In addition, this method has some merits such as simple optical setup, high sensitivity, high stability, and suitability for a little amount of the tested medium in its native state (without dilution).

Paper Details

Date Published: 13 June 2005
PDF: 8 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612482
Show Author Affiliations
Zhi-Cheng Jian, National Chiao Tung Univ. (Taiwan)
Jiun-You Lin, National Changhua Univ. of Education (Taiwan)
Po-Jen Hsieh, National Chiao Tung Univ. (Taiwan)
Huei-Wen Chen, National Chiao Tung Univ. (Taiwan)
Der-Chin Su, National Chiao Tung Univ. (Taiwan)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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