Share Email Print
cover

Proceedings Paper

The evaluation of particle counting efficacy of the new optical scattering method detecting the fluorescence for the particle number concentration standard in liquid
Author(s): Takayuki Sakaguchi; Kensei Ehara
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In order to establish a particle number concentration standard and the related calibration technology in liquids, a new particle counter based on the simultaneous detection of scattered light and fluorescence was examined. Sample particles from 2 to 10 micrometers in diameter were dyed. By making use of the fact that bubbles make no coincidence signals between scattered light and fluorescence on the other hand particles make coincidence signals, we could distinguish particles from bubbles. And we can establish the particle number concentration and the calibration technology in liquid. Using this system, fluorescence could be measured at 525 nm, 625 nm, or 675 nm as well as at 575 nm. To examine the electric counting error and error due to stray light counting, the four channels were compared. The difference in counting between each of the channels was less than 0.1% in relative standard deviation. To evaluate the reliability of the particle counts obtained with this system, the obtained values were compared with counts obtained using a microscope. With a microscope, the total area was manually scanned for the total counting to reduce the statistical uncertainty. The results of both methods were in good agreement, with a counting efficiency of 100% plus or minus 10% for 2 micrometer particles, and of 100% plus or minus 5% for 10 micrometer particles. The difference in the repetition of the new counter was less than 1%.

Paper Details

Date Published: 13 June 2005
PDF: 9 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612472
Show Author Affiliations
Takayuki Sakaguchi, The National Institute of Advanced Industrial Science and Technology (Japan)
Kensei Ehara, The National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top