Share Email Print
cover

Proceedings Paper

Development of measurement of microstructure using moire topography in SEM
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The novel precise three dimensional shape measurement method using SEM and moire topography has been proposed. The possibility for measurement of wave length order by this method has also been shown. In this paper, the method with high resolution power based on the new measurement method is proposed by employing the fringe scanning technology for the shadow moire. The optical system is constructed with SEM using backscattering electrons, the grating holder which can shift the position of the grating, and the grating of which the pitch is 120 micro meter. Measurement using a bearing ball as a sample showed that the high resolution measurement around one macro meter can be performed by introducing the fringe scanning method to the new measurement.

Paper Details

Date Published: 13 June 2005
PDF: 7 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612442
Show Author Affiliations
Yasuhiko Arai, Kansai Univ. (Japan)
Shunsuke Yokozeki, Jyouko Applied Optics Lab. (Japan)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top