Share Email Print

Proceedings Paper

Automatic tracing of interference fringes using Fourier filtering, local averaging and simultaneous horizontal and vertical scans
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Inteferograms are made by interfering wave fronts and hence contain important information about them. Analysis of interferogram requires the identification of all the fringes and their exterma. Here an algorithm for computer tracing of interference fringes is described. The method uses a Fourier filter for removing high frequency noise, a local averaging for binarization of images not having uniform intensity distribution, scanning the interferogram locally both horizontally and vertically to determine the type of the scan, local application of simultaneous horizontal and vertical scan for tracing of complicated fringe patterns and removal of the noise from the traces by determining the number of connected pixels. The poroposed algorithm was found to yield good result even for high noise images.

Paper Details

Date Published: 13 June 2005
PDF: 6 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612417
Show Author Affiliations
Arun Anand, MS Univ. of Baroda (India)
Vani K. Chhaniwal, MS Univ. of Baroda (India)

Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top