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Proceedings Paper

A novel processing technique for tomographic image reconstruction
Author(s): Joris Vanherzeele; Steve Vanlanduit; Patrick Guillaume
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Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, ; doi: 10.1117/12.612250
Show Author Affiliations
Joris Vanherzeele, Vrije Univ. Brussel (Belgium)
Steve Vanlanduit, Vrije Univ. Brussel (Belgium)
Patrick Guillaume, Vrije Univ. Brussel (Belgium)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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