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Proceedings Paper

White-light spectral interferometric technique used to measure the dispersion of the group birefringence of a uniaxial crystal
Author(s): Petr Hlubina
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Paper Abstract

A new spectral-domain interferometric technique employing a simple experimental setup is used to measure the group birefringence of a uniaxial crystal of known thickness over the wavelength range of the visible spectrum. The experimental setup comprising a white-light source, a Michelson interferometer, a polarizer, a uniaxial crystal, an analyzer, and a low-resolution spectrometer is utilized to record a series of spectral interferograms for different optical path differences (OPDs) adjusted in the Michelson interferometer. The spectral interferograms include interference fringes resolved only in a narrow spectral range around the so-called equalization wavelength at which the overall group OPD between interfering beams is zero. We measure the equalization wavelength as a function of the OPD in the Michelson interferometer to obtain directly the wavelength dependence of the group birefringence of a calcite crystal. Using the calcite crystal of two different thicknesses, we confirm that the measured dispersion of the group birefringence agrees well with the theoretical one. The thicknesses of the calcite crystal are also determined precisely from the slopes of linear dependences of the measured OPDs on the theoretical group birefringences.

Paper Details

Date Published: 13 June 2005
PDF: 9 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612249
Show Author Affiliations
Petr Hlubina, Technical Univ. Ostrava (Czech Republic)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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